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No file available [This article belongs to Volume - 55, Issue - 6]
Gongcheng Kexue Yu Jishu/Advanced Engineering Science
Journal ID : AES-29-05-2023-570
Title : Process variation effects and performance analysis of Analog to digital convertor and its effect at lower technology nodes
Kumaraswamy K V, , VijayaPrakash A M,

Abstract : This paper describes the process variation and it effect on ADC considering the all corners of the CMOS technology, explains how the process variation at every corner at deep submicron nodes and one of the electrical parameter of device components changes at device process corners. A brief working principle about Analog to digital circuits is given, as well as a explanation of process variations. This specific circuit design carried out using submicron foundry based process design kit. In a mode

Keywords : process, variation, effects